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研究生: 張群榮
Chang, Chun-Rong
論文名稱: 應用於高速電路之π型靜電放電防護設計
π-Shape ESD Protection Design for High-Speed Circuit
指導教授: 林群祐
Lin, Chun-Yu
口試委員: 林群祐
Lin, Chun-Yu
彭盛裕
Peng, Sheng-Yu
蔡銘憲
Tsai, Ming-Hsien
口試日期: 2023/04/27
學位類別: 碩士
Master
系所名稱: 電機工程學系
Department of Electrical Engineering
論文出版年: 2023
畢業學年度: 111
語文別: 英文
論文頁數: 69
中文關鍵詞: 全晶片靜電放電防護π型分散式電路高速電路
英文關鍵詞: whole-chip ESD protection, π-shape discrete circuits, high-speed circuit
研究方法: 實驗設計法
DOI URL: http://doi.org/10.6345/NTNU202300530
論文種類: 學術論文
相關次數: 點閱:83下載:0
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  • Contents Abstract (Chinese) I Abstract (English) II Acknowledgement III Contents V List of Tables VIII List of Figures IX Chapter 1 Introduction 1 1.1 Motivation 1 1.2 Concept of ESD 2 1.3 ESD Test Standards 2 1.4 Design Criterion of ESD Protection Circuit 5 1.5 Organization of This Thesis 8 Chapter 2 Studies of ESD Protection Circuits for High-Speed Applications 9 2.1 Effect of ESD Protection Circuits for High-Speed Circuits 9 2.2 Prior Art of High-Frequency and High-Speed applications 11 2.2.1 Single-stage ESD Protection Circuit 11 2.2.2 Two-stage distributed ESD Protection Circuit 15 Chapter 3  Proposed π-shape Power-Line Triggered Silicon-controlled rectifier (π-PLTSCR) 17 3.1 Design Concepts of π-shape ESD Protection Circuit 17 3.2 Traditional π-shape Diode (π-Diode) 18 3.3 Traditional π- shape SDSCR (π-SDSCR) 20 3.4 Traditional π- shape RTSCR (π-RTSCR) 22 3.5 Proposed π- shape PLTSCR (π-PLTSCR) 24 3.6 Simulation Results 26 3.7 Measurement Results 29 3.7.1 High-Frequency Performance 29 3.7.2 TLP I-V Curves 31 3.7.3 DC Leakage Current Measurement 35 3.7.4 HBM Test 35 3.8 Comparison 36 3.9 Summary 37 Chapter 4  Verification of Proposed π-PLTSCR with Trans-Impedance Amplifier (TIA) 39 4.1 Background of TIA 39 4.2 Structure of TIA 39 4.3 Simulation Results of TIA 40 4.3.1 TIA w/o Protection 40 4.3.2 TIA with Traditional π-Diode 41 4.3.3 TIA with Traditional π-SDSCR 43 4.3.4 TIA with Traditional π-RTSCR 44 4.3.5 TIA with Proposed π-PLTSCR 46 4.4 Measurement Results of TIA 47 4.4.1 High-frequency Performance 47 4.4.2 TLP I-V Curves 50 4.4.3 TBM Test 52 4.5 Comparison 56 4.6 Summary 58 Chapter 5 Conclusion and Future Work 59 5.1 Conclusion 59 5.2 Future Work 60 Reference 64 Vita 68 Publication 69

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