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研究生: 劉玠汶
論文名稱: 低磁場核磁共振系統應用於Fe304-Anti CRP之磁鬆弛研究
指導教授: 楊鴻昌
Yang, Hong-Chang
洪姮娥
Horng, Herng-Er
學位類別: 碩士
Master
系所名稱: 光電工程研究所
Graduate Institute of Electro-Optical Engineering
論文出版年: 2011
畢業學年度: 99
語文別: 中文
論文頁數: 35
中文關鍵詞: 超導量子干涉元件核磁共振造影
論文種類: 學術論文
相關次數: 點閱:125下載:0
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  • 我們將預先極化技術以及超導量子干涉元件(Superconducting quantum interference device, SQUID)應用於低磁場核磁共振及核磁造影系統上。重新設計靜磁場及梯度磁場線圈,使得磁場均勻度在5×5×5 cm3內可達萬分之一,在補償一z方向梯度磁場下,10 ml水量的線寬為0.8 Hz,訊雜比為110。在磁性奈米粒子之磁鬆弛量測方面,固定MF Anti-CRP濃度下,其線寬會隨著本身樣品的溫度上升而下降。而橫向鬆弛時間(T2)之倒數隨著MF Anti-CRP濃度增加而成一線性增加關係。於核磁共振造影中,在梯度磁場33 μT/m下,解析度約為0.07公分。

    第一章 緒論 1 第二章 實驗原理 2 2-1 低磁場之核磁共振介紹 2 2-2 核磁共振原理 3 2-2-1 核磁共振 3 2-1-2 縱向鬆弛與橫向鬆弛 5 2-3 磁性標記免疫檢測 10 2-3-1 磁性標記免疫檢測原理 10 2-3-2 C-反應蛋白(C-reactive Protein, CRP)簡介 10 第三章 實驗架構 12 3-1 系統架構介紹 12 3-2 靜磁場 (Static Field)之設計 14 3-3 梯度磁場 (Gradient Field) 16 3-3-1 梯度磁場之設計 16 3-3-2 梯度磁場之校正與線寬量測 18 4-1 實驗中樣品之溫度變化與線寬 21 4-2不同濃度MF-Anti CRP之T2量測 26 4-2不同濃度MF-Anti CRP之T2量測 26 4-3 核磁共振造影 29 第五章 結論 32 參考文獻 33

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